Wafer 147 has been annealed for 2 weeks at 150 degrees C.

Changes in die classification after annealing:

good -> fair :  0 die
good -> bad :  0
fair -> good :  1 ( die # 124 )
fair -> bad :    0
bad -> good :  0
bad -> fair :    2 ( # 45, 58 )
No change :    131

Die quality before annealing, after annealing, 2nd reprobing

Pipeline quality map before annealing, after annealing, 2nd reprobing

Map of die failures before annealing, after annealing, 2nd reprobing

Map of random bad cells before annealing, after annealing, 2nd reprobing