Good Hybrid Criteria
(rev. 10/11/99)
(1) Number of
bad channels
N or fewer, where N is the number of chips.
No more than 2 bad channels in any chip.
At most 1 per HYBRID for L0s assembled after 10/10/99.
At most 30 per HYBRID for L0s assembled after 10/10/99.
(3) All tests are passed with BIAS RATIO SELECT = 1.
(4) No bad cell-IDs across all channles in a chip.
(5) Median current consumption 90mA/chip for AVDD and
20mA/chip for DVDD.
As measured by the LBNL burn-in setup.
(6) Fixes for hybrid opens: 2 or fewer (3 for L3-phi and L4).
Only wirebonds and soldered discrete wires allowed in the fix.
Opens in ISLOPE resistor pad to be addressed by moving resistor
to spare component pad, and not counted as fixes.
(7) Fixes for cable opens: at most 1.
Fix must use soldered and tacked down wire.
(8) Fixes for hybrid shorts: at most 1.
Fix cannot involve glued-on extra components.