Wafer 140 has been annealed for 2 weeks at 150 degrees C.
Changes in die classification after annealing:
good -> fair : 0 die
good -> bad : 2 ( die # 97, 104 )
fair -> good : 0
fair -> bad : 0
bad -> good : 0
bad -> fair : 1 ( # 55 )
No change : 137
Die quality before annealing, after annealing
Pipeline quality map before annealing, after annealing
Map of die failures before annealing, after annealing
Map of random bad cells before annealing, after annealing