Maps for SVX3D wafer 140 annealed at Honeywell

Wafer 140 has been annealed for 2 weeks at 150 degrees C.

Changes in die classification after annealing:

good -> fair :  0 die
good -> bad :  2 ( die # 97, 104 )
fair -> good :  0
fair -> bad :    0
bad -> good :  0
bad -> fair :    1 ( # 55 )
No change :    137

Die quality before annealing, after annealing

Pipeline quality map before annealing, after annealing

Map of die failures before annealing, after annealing

Map of random bad cells before annealing, after annealing


Questions? E-mail to igv@lbl.gov