Maps for SVX3D wafer 148 annealed at Honeywell

Wafer 148 has been annealed for 2 weeks at 150 degrees C.

Annealing resulted in no changes in die classification.

Die quality before annealing, after annealing

Pipeline quality map before annealing, after annealing

Map of die failures before annealing, after annealing

Map of random bad cells before annealing, after annealing


Questions? E-mail to igv@lbl.gov