Wafer 74 has been annealed for 2 weeks at 150 degrees C.

Changes in die classification after annealing:

good -> fair :  0 die
good -> bad :  2 ( die # 7, 104 )
fair -> good :  0
fair -> bad :    4 ( # 9, 34, 53, 95 )
bad -> good :  0
bad -> fair :    1 ( # 49 )
No change :    127

Die quality before annealing, after annealing

Pipeline quality map before annealing, after annealing

Map of die failures before annealing, after annealing

Map of random bad cells before annealing, after annealing