Click on the wafer number in the table below to get its map
in Postscript. Standard 6-in wafer quality maps are here.
Only pedestal/noise and calibration mask tests are used to create the maps
linked to this page.
In these maps the number of "random" bad pipeline cells
is printed in the middle of each die. Those are bad cells
which have not been associated with bad channels.
Note that the total number of cells in the pipeline is 5888.
The "no info" dies are those dies which
were rejected by the testing procedure before the pedestal/noise measurements.
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