Click on letters in the "Maps" column to get various wafer maps in Postscript:
A -- standard wafer quality map
B -- map of die failure types
C -- pipeline quality map
D -- map of "random" bad pipeline cells

* -- This wafer was not backgrinded and backplated because it was used for annealing studies. The yield numbers and maps are determined after annealing.

The average yield of good dice in the above sample is 42.3 %. The combined yield of good and fair dice is 52.8 %.