Maps for 6-in SVX3D wafers from lot 15

Click on letters in the "Maps" column to get various wafer maps in Postscript:
A -- standard wafer quality map
B -- map of die failure types
C -- pipeline quality map
D -- map of "random" bad pipeline cells

 Wafer # 
 Manufacturer # 
 Good die yield (%) 
 Good+fair yield (%) 
    Maps    
206
21316-15-02
28.4
53.0
A, B, C, D
207
21316-15-14
29.1
54.5
A, B, C, D
208
21316-15-05
3.0
16.4
A, B, C, D
209
21316-15-04
0.0
0.0
A, B, C, D
210
21316-15-12
17.9
44.8
A, B, C, D
211
21316-15-19
9.7
28.4
A, B, C, D
212
21316-15-08
0.0
2.2
A, B, C, D
213
21316-15-18
0.7
1.5
A, B, C, D
214
21316-15-11
0.0
0.0
A, B, C, D
216
21316-15-06
0.0
6.0
A, B, C, D
217
21316-15-16
13.4
35.8
A, B, C, D
218
21316-15-15
1.5
6.0
A, B, C, D
219
21316-15-07
0.0
0.7
A, B, C, D
220
21316-15-13
0.0
0.0
A, B, C, D
221
21316-15-17
23.1
42.5
A, B, C, D
222
21316-15-10
18.7
41.0
A, B, C, D
223
21316-15-20
11.2
29.9
A, B, C, D
224
21316-15-09
24.6
47.0
A, B, C, D
225
21316-15-01
3.0
8.2
A, B, C, D

Total number of wafers in this lot is 19. The average yield of good dice in the lot is 9.7 %. The combined yield of good and fair dice is 22.0 %.

Questions? E-mail to igv@lbl.gov