Maps for 6-in SVX3D wafers from lot 16

Click on letters in the "Maps" column to get various wafer maps in Postscript:
A -- standard wafer quality map
B -- map of die failure types
C -- pipeline quality map
D -- map of "random" bad pipeline cells

 Wafer # 
 Manufacturer # 
 Good die yield (%) 
 Good+fair yield (%) 
    Maps    
231
21316-16-10
5.2
11.2
A, B, C, D
232
21316-16-15
6.7
17.9
A, B, C, D
233
21316-16-05
40.3
57.5
A, B, C, D
234
21316-16-01
29.1
49.3
A, B, C, D
235
21316-16-09
0.7
4.5
A, B, C, D
236
21316-16-03
41.0
55.2
A, B, C, D
237
21316-16-02
9.7
14.9
A, B, C, D
238
21316-16-13
48.5
64.9
A, B, C, D
239
21316-16-14
19.4
38.1
A, B, C, D
240
21316-16-07
20.1
35.8
A, B, C, D
241
21316-16-12
21.6
35.8
A, B, C, D
242
21316-16-04
30.6
43.3
A, B, C, D
243
21316-16-08
29.1
35.8
A, B, C, D
244
21316-16-11
9.0
17.2
A, B, C, D
245
21316-16-06
9.0
23.1
A, B, C, D
246
21316-16-16
28.4
41.0
A, B, C, D

Total number of wafers in this lot is 16. The average yield of good dice in the lot is 21.8 %. The combined yield of good and fair dice is 34.1 %.

Questions? E-mail to igv@lbl.gov