Click on letters in the "Maps" column to get various wafer maps in Postscript:
A -- standard wafer quality map
B -- map of die failure types
C -- pipeline quality map
D -- map of "random" bad pipeline cells

Lot 13
 

Wafer #	Manufacturer #	Good die yield (%)	Good+fair yield (%)	Maps
187*	21316-13-12	18.7	52.2	A, B, C, D
188*	21316-13-07	32.8	56.0	A, B, C, D
189*	21316-13-04	25.4	47.8	A, B, C, D
190*	21316-13-01	9.0	29.9	A, B, C, D
229	21316-13-13	13.4	34.3	A, B, C, D
230	21316-13-20	4.5	11.2	A, B, C, D

The average yield of good dice in the above sample is 17.3 %. The combined yield of good and fair dice is 38.6 %.

Lot 14
 

Wafer #	Manufacturer #	Good die yield (%)	Good+fair yield (%)	Maps
191*	21316-14-11	43.3	52.2	A, B, C, D
192*	21316-14-04	47.0	65.7	A, B, C, D
193*	21316-14-20	47.8	63.4	A, B, C, D
194*	21316-14-16	35.8	59.0	A, B, C, D
195*	21316-14-07	52.2	66.4	A, B, C, D
196	21316-14-01	13.4	27.6	A, B, C, D
197	21316-14-05	36.6	60.4	A, B, C, D
198	21316-14-15	53.7	69.4	A, B, C, D
199	21316-14-17	34.3	59.0	A, B, C, D
200	21316-14-18	32.8	49.3	A, B, C, D
201	21316-14-08	29.9	49.3	A, B, C, D
202	21316-14-10	50.0	64.2	A, B, C, D
203	21316-14-14	47.0	65.7	A, B, C, D
204	21316-14-03	47.8	62.7	A, B, C, D
205	21316-14-02	47.8	63.4	A, B, C, D
215	21316-14-06	44.8	64.9	A, B, C, D
226	21316-14-12	47.8	62.7	A, B, C, D
227	21316-14-13	40.3	53.7	A, B, C, D
228	21316-14-19	49.3	62.7	A, B, C, D

Total number of wafers in lot 14 is 19. The average yield of good dice for this lot is 42.2 %. The combined yield of good and fair dice is 59.0 %.

* -- These wafers were probed before backgrinding and backplating.