Die Re-Probing statistics from 6/6/99 on: Postscript plot and Notes

Time Evolution of loss fraction for die found good+fair at wafer probing

Dynamic Pedestal Subtraction in dead-timeless mode

Compilation of curious features and known bugs

SVX3 chip Analog Measurement Guidelines

SVX3B,C,D Noise Measurement Results Summary

This is a picture of the SVX3D chip.

	Dead-timeless performance of chip on a test board.
	Analog noise performance of irradiated and un-irradiated chip.
	Photograph of an SVX3D chip.
	Photo of automatic probe station that probed all SVX chips for CDF, all SVX2 chips for D0, and is now probing SVX3 wafers for CDF-II.